검색결과 : 2건
No. | Article |
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1 |
X-ray diffraction imaging of GaN-based heterostructures on SiC Poust B, Feichtinger P, Sandhu R, Smorchkova I, Heying B, Block T, Wojtowicz M, Goorsky M Materials Science Forum, 457-460, 1601, 2004 |
2 |
New factors for capital cost estimation in evolving process designs Brennan DJ, Golonka KA Chemical Engineering Research & Design, 80(6), 579, 2002 |