검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Copper crystals on the (110) sapphire plane: orientation relationships, triple line ridges and interface shape equilibrium Curiotto S, Chien H, Meltzman H, Labat S, Wynblatt P, Rohrer GS, Kaplan WD, Chatain D Journal of Materials Science, 48(7), 3013, 2013 |
| 2 |
Stress measurements in tungsten coated through silicon vias for 3D integration Krauss C, Labat S, Escoubas S, Thomas O, Carniello S, Teva J, Schrank F Thin Solid Films, 530, 91, 2013 |
| 3 |
Strain inhomogeneity in copper islands probed by coherent X-ray diffraction Beutier G, Verdier M, Parry G, Gilles B, Labat S, Richard MI, Cornelius T, Lory PF, Hoang SV, Livet F, Thomas O, de Boissieu M Thin Solid Films, 530, 120, 2013 |
| 4 |
Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging Labat S, Chamard V, Thomas O Thin Solid Films, 515(14), 5557, 2007 |
| 5 |
X-ray scattering: A powerful probe of lattice strain in materials with small dimensions Thomas O, Loubens A, Gergaud P, Labat S Applied Surface Science, 253(1), 182, 2006 |
| 6 |
Chemically diffuse interface in (111) Au-Ni multilayers: an anomalous X-ray diffraction analysis Bigault T, Bocquet F, Labat S, Thomas O, Renevier H Applied Surface Science, 188(1-2), 110, 2002 |
| 7 |
Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM Labat S, Guichet C, Thomas O, Gilles B, Marty A Applied Surface Science, 188(1-2), 182, 2002 |
| 8 |
Limits of validity of the crystallite group method in stress determination of thin film structures Gergaud P, Labat S, Thomas O Thin Solid Films, 319(1-2), 9, 1998 |
| 9 |
Structure characterization of metallic multilayers by symmetric and asymmetric X-ray diffraction Gladyszewski G, Labat S, Gergaud P, Thomas O Thin Solid Films, 319(1-2), 78, 1998 |
| 10 |
Microstructure and Residual-Stresses in (111)Au/Ni Multilayers Labat S, Pichaud B, Thomas O, Alfonso C, Charai A, Barrallier L, Gilles B, Marty A Thin Solid Films, 275(1-2), 29, 1996 |