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Electrochemical performance of La0.8Sr0.2MnO3 oxygen electrode promoted by Ruddlesden-Popper structured La2NiO4 Akbari Z, Babaei A Journal of the American Ceramic Society, 103(2), 1332, 2020 |
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Enhanced performance and stability of La2NiO4+delta impregnated La0.8Sr0.2Co0.8Ni0.2O3-delta oxygen electrodes for solid oxide electrolysis cells Liu YH, Shuang JW, Tong X, Yang SB, Yang Y, Wei MR Electrochimica Acta, 298, 852, 2019 |
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Experimental and numerical study of oxygen separation and oxy-combustion characteristics inside a button-cell LNO-ITM reactor Nemitallah MA, Habib MA, Mezghani K Energy, 84, 600, 2015 |
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Long-term stability of the IT-SOFC cathode materials La0.6Sr0.4CoO3 (-) (delta) and La2NiO4+ (delta) against combined chromium and silicon poisoning Schrodl N, Bucher E, Egger A, Kreiml P, Teichert C, Hoschen T, Sitte W Solid State Ionics, 276, 62, 2015 |
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High performance La2NiO4+delta-infiltrated (La0.6Sr0.4)(0.995)Co0.2Fe0.8O3-delta cathode for solid oxide fuel cells Zhang XX, Zhang H, Liu XB Journal of Power Sources, 269, 412, 2014 |
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New defect-crystal-chemical approach to non-Vegardianity and complex defect structure of fluorite-based MO2-LnO(1.5) solid solutions (M4+ = Ce, Th; Ln(3+) = lanthanide) part I: Model description and lattice-parameter data analysis Nakamura A Solid State Ionics, 181(35-36), 1543, 2010 |
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New defect-crystal-chemical approach to non-Vegardianity and complex defect structure of fluorite-based MO2-LnO(1.5) solid solutions (M4+ = Ce, Th; Ln(3+) = lanthanide) Part II: Detailed local-structure and ionic-conductivity analysis Nakamura A Solid State Ionics, 181(37-38), 1631, 2010 |
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Effect of LaNiO3 electrodes and lead oxide excess on chemical solution deposition derived Pb(Zr-x, Ti1-x)O-3 films Shturman I, Shter GE, Etin A, Grader GS Thin Solid Films, 517(8), 2767, 2009 |
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Deflection of wafers and cantilevers with Pt/LNO/PZT/LNO/Pt/Ti/SiO2 multilayered structure Kobayashi T, Ichiki M, Noguchi T, Maeda R Thin Solid Films, 516(16), 5272, 2008 |
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Comparison of structural and electrical properties of PMN-PT films deposited on Si with different bottom electrodes Detalle M, Wang G, Remiens D, Ruterana P, Roussel P, Dkhil B Journal of Crystal Growth, 305(1), 137, 2007 |