검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Systematic method for electrical characterization of random telegraph noise in MOSFETs Marquez C, Rodriguez N, Gamiz F, Ohata A Solid-State Electronics, 128, 115, 2017 |
| 2 |
Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors Kwon SK, Kwon HM, Choi WI, Song HS, Lee HD Solid-State Electronics, 119, 29, 2016 |
| 3 |
Methodology for 1/f noise parameter extraction for high-voltage MOSFETs Mavredakis N, Pflanzl W, Seebacher E, Bucher M Solid-State Electronics, 103, 202, 2015 |
| 4 |
LFN and LSCFN perovskites - structure and transport properties Swierczek K, Marzec J, Palubiak D, Zajac W, Molenda J Solid State Ionics, 177(19-25), 1811, 2006 |
| 5 |
Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs Dieudonne F, Haendler S, Jomaah J, Balestra F Solid-State Electronics, 48(6), 985, 2004 |