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| No. | Article |
|---|---|
| 1 |
Correlation between barrier inhomogeneities of 4H-SiC 1 A/600 V Schottky rectifiers and deep-level defects revealed by DLTS and Laplace DLTS Gelczuk L, Kamyczek P, Placzek-Popko E, Dabrowska-Szata M Solid-State Electronics, 99, 1, 2014 |