검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Hot-carrier degradation in deep-submicrometer nMOSFETs: lightly doped drain vs. large angle tilt implanted drain Rafi JM, Campabadal F Solid-State Electronics, 45(8), 1391, 2001 |
| No. | Article |
|---|---|
| 1 |
Hot-carrier degradation in deep-submicrometer nMOSFETs: lightly doped drain vs. large angle tilt implanted drain Rafi JM, Campabadal F Solid-State Electronics, 45(8), 1391, 2001 |