검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Cross-sectional transmission electron microscopy method and studies of implant damage in single crystal diamond Hickey DP, Kuryliw E, Siebein K, Jones KS, Chodelka R, Elliman R Journal of Vacuum Science & Technology A, 24(4), 1302, 2006 |
| 2 |
Effect of stress on the evolution of mask-edge defects in ion-implanted silicon Olson CR, Kuryliw E, Jones BE, Jones KS Journal of Vacuum Science & Technology B, 24(1), 446, 2006 |