화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Arsenic atomic layer doping in Si using AsH3
Yamamoto Y, Kurps R, Murota J, Tillack B
Solid-State Electronics, 110, 29, 2015
2 Phosphorus atomic layer doping in Ge using RPCVD
Yamamoto Y, Kurps R, Mai C, Costina I, Murota J, Tillack B
Solid-State Electronics, 83, 25, 2013
3 B atomic layer doping of Ge
Yamamoto Y, Kopke K, Kurps R, Murota J, Tillack B
Thin Solid Films, 518, S44, 2010
4 Selective vapor phase etching of SiGe by HCl in a RPCVD reactor
Yamamoto Y, Kopke K, Kurps R, Tillack B
Applied Surface Science, 254(19), 6037, 2008
5 P doping control during SiGe : C epitaxy
Yamamoto Y, Tillack B, Kopke K, Kurps R
Thin Solid Films, 508(1-2), 288, 2006
6 Circuit applications of high-performance SiGe : C HBTs integrated in BiCMOS technology
Winkler W, Borngraber J, Heinemann B, Rucker H, Barth R, Bauer J, Bolze D, Drews J, Ehwald KE, Grabolla T, Haak U, Hoppner W, Knoll D, Kruger D, Kuck B, Kurps R, Marschmeyer M, Richter H, Schley P, Schmidt D, Scholz R, Tillack B, Wolansky D, Wulf HE, Yamamoto Y, Zaumseil P
Applied Surface Science, 224(1-4), 297, 2004
7 Diffusion and segregation of shallow As, and Sb junctions in silicon
Kruger D, Rucker H, Heinemann B, Melnik V, Kurps R, Bolze D
Journal of Vacuum Science & Technology B, 22(1), 455, 2004
8 Oxide formation during ion bombardment of small silicon structures
Kruger D, Formanek P, Pippel E, Woltersdorf J, Bugiel E, Kurps R, Weidner G
Journal of Vacuum Science & Technology B, 22(3), 1179, 2004
9 Transient processes and structural transformations in Si(x)Gel(1-x) layers during oxygen implantation and sputtering
Kruger D, Efremov AA, Murota J, Tillack B, Kurps R, Romanova GP
Applied Surface Science, 203, 285, 2003
10 Thermal stability of Pr2O3 films grown on Si(100) substrate
Goryachko A, Liu JP, Kruger D, Osten HJ, Bugiel E, Kurps R, Melnik V
Journal of Vacuum Science & Technology A, 20(6), 1860, 2002