검색결과 : 2건
No. | Article |
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1 |
Progressive degradation in a-Si : H/SiN thin film transistors Merticaru AR, Mouthaan AJ, Kuper FG Thin Solid Films, 427(1-2), 60, 2003 |
2 |
Reliability implications in advanced embedded two-transistor-Fowler-Nordheim-NOR flash memory devices Scarpa A, Tao G, Dijkstra J, Kuper FG Solid-State Electronics, 46(11), 1765, 2002 |