검색결과 : 1건
No. | Article |
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1 |
X-ray characterization of 3 inch diameter 4H and 6H-SiC experimental wafers Kuhr TA, Vetter WM, Dudley M, Skowronski M Materials Science Forum, 338-3, 473, 2000 |
No. | Article |
---|---|
1 |
X-ray characterization of 3 inch diameter 4H and 6H-SiC experimental wafers Kuhr TA, Vetter WM, Dudley M, Skowronski M Materials Science Forum, 338-3, 473, 2000 |