검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Solar cell degradation caused by glass superstrate corrosion Kudriavtsev Y, Hernandez AG, Asomoza R Solar Energy, 187, 82, 2019 |
| 2 |
White luminescence emission from silicon implanted germanium Hernandez AG, Escobosa-Echavarria AE, Kudriavtsev Y Applied Surface Science, 428, 1098, 2018 |
| 3 |
Water vapor interaction with borosilicate glass Kudriavtsev Y, Avendano M, Ramirez G, Asomoza-Palacio R, Manzanilla-Naim L Solid State Ionics, 321, 122, 2018 |
| 4 |
Sn doped GaSb grown by liquid phase epitaxy Compean-Jasso VH, de Anda F, Mishurnyi VA, Gorbatchev AY, Prutskij T, Kudriavtsev Y Thin Solid Films, 548, 168, 2013 |
| 5 |
Electrical and optical properties of Si doped GaAs (631) layers studied as a function of the growth temperature Vazquez-Cortas D, Shimomura S, Lopez-Lopez M, Cruz-Hernandez E, Gallardo-Hernandez S, Kudriavtsev Y, Mendez-Garcia VH Journal of Crystal Growth, 347(1), 77, 2012 |
| 6 |
Probability of ionization of sputtered particles as a function of their energy - Part I: Negative Si- ions Kudriavtsev Y, Villegas A, Gallardo S, Asomoza R Applied Surface Science, 254(7), 2059, 2008 |
| 7 |
Ionization probability of sputtered particles as a function of their energy - Part II. Positive Si+ ions Kudriavtsev Y, Gallardo S, Villegas A, Ramirez G, Asomoza R Applied Surface Science, 254(13), 3801, 2008 |
| 8 |
Critical distance for secondary ion formation: Experimental SIMS measurements Kudriavtsev Y, Gallardo S, Villegas A, Ramirez G, Asomoza R Applied Surface Science, 255(4), 877, 2008 |
| 9 |
SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ions Koudriavtseva O, Morales-Acevedo A, Kudriavtsev Y, Gallardo S, Asomoza R, Mendoza-Perez R, Sastre-Hernandez J, Contreras-Puente G Applied Surface Science, 255(4), 1423, 2008 |
| 10 |
Influence of the GaAs substrate orientation on the composition of GaxIn1-xP (x approximate to 0.5) grown by LPE and MOCVD Mishumyi VA, de Anda F, Gorbatchev AY, Kudriavtsev Y, Elyukhin VA, Prutskij T, Pelosi C, Bocchi C, Ber BY, Vazquez FEO Thin Solid Films, 516(22), 8092, 2008 |