검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
New calibration method for UV-VIS photothermal deflection spectroscopy set-up Sancho-Parramon J, Ferre-Borrull J, Bosch S, Krasilnikova A, Bulir J Applied Surface Science, 253(1), 158, 2006 |
| 2 |
Development and test of a new grating-polarimeter and its application in ellipsometric measurements Masetti E, Krasilnikova A Thin Solid Films, 455-56, 138, 2004 |
| 3 |
Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films Masetti E, Bulir J, Gagliardi S, Janicki V, Krasilnikova A, Di Santo G, Coluzza C Thin Solid Films, 455-56, 468, 2004 |
| 4 |
Sputter deposited cerium-vanadium oxide: optical characterization and electrochromic behavior Masetti E, Varsano F, Decker F, Krasilnikova A Electrochimica Acta, 46(13-14), 2085, 2001 |