검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
How hot is the wire: Optical, electrical, and combined methods to determine filament temperature Onnink AJ, Schmit J, Kovalgin AY Thin Solid Films, 674, 22, 2019 |
| 2 |
Selenidation of epitaxial silicene on ZrB2 Wiggers FB, Yamada-Takamura Y, Kovalgin AY, de Jong MP Applied Surface Science, 428, 793, 2018 |
| 3 |
Low-resistivity alpha-phase tungsten films grown by hot-wire assisted atomic layer deposition in high-aspect-ratio structures Yang MD, Aarnink AAI, Schmitz J, Kovalgin AY Thin Solid Films, 646, 199, 2018 |
| 4 |
Inherently area-selective hot-wire assisted atomic layer deposition of tungsten films Yang MD, Aarnink AAI, Schmitz J, Kovalgin AY Thin Solid Films, 649, 17, 2018 |
| 5 |
Fabrication and properties of GeSi and SiON layers for above-IC integrated optics Schmitz J, Rangarajan B, Kovalgin AY Solid-State Electronics, 108, 8, 2015 |
| 6 |
On the difference between optically and electrically determined resistivity of ultra-thin titanium nitride films Van Bui H, Kovalgin AY, Wolters RAM Applied Surface Science, 269, 45, 2013 |
| 7 |
Nanoscale carrier injectors for high luminescence Si-based LEDs Piccolo G, Kovalgin AY, Schmitz J Solid-State Electronics, 74, 43, 2012 |
| 8 |
Growth Kinetics and Oxidation Mechanism of ALD TiN Thin Films Monitored by In Situ Spectroscopic Ellipsometry Van Bui H, Groenland AW, Aarnink AAI, Wolters RAM, Schmitz J, Kovalgin AY Journal of the Electrochemical Society, 158(3), H214, 2011 |
| 9 |
Low Specific Contact Resistance of NiSi and PtSi to Si: Impact of Interface Tiggelman N, Kovalgin AY, Brennan R, Wolters RAM Electrochemical and Solid State Letters, 13(12), H450, 2010 |
| 10 |
Low-temperature SiO2 layers deposited by combination of ECR plasma and supersonic silane/helium jet Kovalgin AY, Isai G, Holleman J, Schmitz J Journal of the Electrochemical Society, 155(2), G21, 2008 |