검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Electromigration in Alsicu/Tin/Ti Interconnects with Ti and Tin Additional Layers Sekiguchi M, Sawada K, Fukumoto M, Kouzaki T Journal of Vacuum Science & Technology B, 12(5), 2992, 1994 |
| No. | Article |
|---|---|
| 1 |
Electromigration in Alsicu/Tin/Ti Interconnects with Ti and Tin Additional Layers Sekiguchi M, Sawada K, Fukumoto M, Kouzaki T Journal of Vacuum Science & Technology B, 12(5), 2992, 1994 |