| 1 |
Infrared spectroscopic ellipsometry and atomic force microscopy study of plasma polymerized hexamethyldisiloxane layers post-treated by NH3 plasma
Tsankov D, Radeva E, Hinrichs K, Roseler A, Korte EH
Thin Solid Films, 476(1), 174, 2005 |
| 2 |
Infrared ellipsometric studies of mixing in a thin double layer of poly(n-butyl methacrylate)/poly(vinyl chloride)
Nikonenko NA, Hinrichs K, Korte EH, Pionteck J, Eichhorn KJ
Macromolecules, 37(23), 8661, 2004 |
| 3 |
Structure analysis of organic films by mid-infrared ellipsometry
Hinrichs K, Roseler A, Gensch M, Korte EH
Thin Solid Films, 455-56, 266, 2004 |
| 4 |
Infrared ellipsometry of Langmuir-Blodgett films on gold. Toward interpreting the molecular orientation
Tsankov D, Hinrichs K, Korte EH, Dietel R, Roseler A
Langmuir, 18(17), 6559, 2002 |
| 5 |
Infrared ellipsometric analysis of organic film-on-substrate samples
Roseler A, Korte EH
Thin Solid Films, 313-314, 708, 1998 |
| 6 |
The optical constants of metallic island films as used for surface enhanced infrared absorption
Roseler A, Korte EH
Thin Solid Films, 313-314, 732, 1998 |
