화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Properties of InGaAs/GaAs metal-oxide-semiconductor heterostructure field-effect transistors modified by surface treatment
Gregusova D, Gucmann F, Kudela R, Micusik M, Stoklas R, Valik L, Gregus J, Blaho M, Kordos P
Applied Surface Science, 395, 140, 2017
2 Finite element simulation of metal-semiconductor-metal photodetector
Guarino G, Donaldson WR, Mikulics M, Marso M, Kordos P, Sobolewski R
Solid-State Electronics, 53(10), 1144, 2009
3 Transport properties of AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with Al2O3 of different thickness
Kordos P, Gregusova D, Stoklas R, Gazi S, Novak J
Solid-State Electronics, 52(6), 973, 2008
4 Determination of the doping concentration profile in Si delta-doped GaAs layers using micro-Raman spectroscopy of bevelled structures
Srnanek R, Geurts J, Lentze M, Irmer G, Kovac J, Donoval D, Mc Phail DS, Kordos P, Florovic M, Vincze A, Sciana B, Radziewicz D, Tlaczala M
Thin Solid Films, 497(1-2), 7, 2006
5 Study of delta-doped GaAs layers by micro-Raman spectroscopy on bevelled samples
Srnanek R, Geurts J, Lentze M, Irmer G, Donoval D, Brdecka P, Kordos P, Forster A, Sciana B, Radziewicz D, Tlaczala M
Applied Surface Science, 230(1-4), 379, 2004
6 Electrical overstress in AlGaN/GaN HEMTs: study of degradation processes
Kuzmik J, Pogany D, Gornik E, Javorka P, Kordos P
Solid-State Electronics, 48(2), 271, 2004
7 Performance of unpassivated AlGaN/GaN/SiC HEMTs after short-term electrical bias stress
Bernat J, Wolter M, Javorka P, Fox A, Marso M, Kordos P
Solid-State Electronics, 48(10-11), 1825, 2004
8 Effect of surface passivation on performance of AlGaN/GaN/Si HEMTs
Bernat J, Javorka P, Fox A, Marso M, Luth H, Kordos P
Solid-State Electronics, 47(11), 2097, 2003
9 Photoenhanced wet etching of gallium nitride in KOH-based solutions
Skriniarova J, Bochem P, Fox A, Kordos P
Journal of Vacuum Science & Technology B, 19(5), 1721, 2001
10 Coupling of insect antennae to field-effect transistors for biochemical sensing
Schroth P, Schoning MJ, Schutz S, Malkoc U, Steffen A, Marso M, Hummel HE, Kordos P, Luth H
Electrochimica Acta, 44(21-22), 3821, 1999