검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Application of ellipsometry for the accurate oxide layer measurement on silicon spheres Busch I, Liu WD, Chen C, Luo ZY, Koenders L Applied Surface Science, 421, 624, 2017 |
| 2 |
Experimental investigation of low-voltage spark ignition caused by separating electrodes Uber C, Shekhar R, Felgner A, Koenders L, Gerlach U Journal of Loss Prevention in The Process Industries, 49, 822, 2017 |
| 3 |
Classification of surface structures on fine metallic wires Bernabeu E, Sanchez-Brea LM, Siegmann P, Martinez-Anton JC, Gomez-Pedrero JA, Wilkening G, Koenders L, Muller F, Hildebrand M, Hermann H Applied Surface Science, 180(3-4), 191, 2001 |
| 4 |
Systematic Investigations of Nanostructuring by Scanning-Tunneling-Microscopy Koning R, Jusko O, Koenders L, Schlachetzki A Journal of Vacuum Science & Technology B, 14(1), 48, 1996 |
| 5 |
Calculation of STM Profiles for Nanometrology Sbosny H, Koenders L, Hietschold M Thin Solid Films, 264(2), 273, 1995 |