검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Nanobeam Diffraction: Technique Evaluation and Strain Measurement on Complementary Metal Oxide Semiconductor Devices Favia P, Gonzales MB, Simoen E, Verheyen P, Klenov D, Bender H Journal of the Electrochemical Society, 158(4), H438, 2011 |
| 2 |
ZrO2 gate dielectrics produced by ultraviolet ozone oxidation for GaN and AlGaN/GaN transistors Dora Y, Han S, Klenov D, Hansen PJ, No KS, Mishra UK, Stemmer S, Speck JS Journal of Vacuum Science & Technology B, 24(2), 575, 2006 |