검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Ellipsometry of surface layers on a 1-kg sphere from natural silicon Klenovsky P, Zuda J, Klapetek P, Humlicek J Applied Surface Science, 421, 542, 2017 |
| 2 |
Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy Klapetek P, Martinek J, Grolich P, Valtr M, Kaur NJ International Journal of Heat and Mass Transfer, 108, 841, 2017 |
| 3 |
Rough surface scattering simulations using graphics cards Klapetek P, Valtr M, Poruba A, Necas D, Ohlidal M Applied Surface Science, 256(18), 5640, 2010 |
| 4 |
Near-field scanning optical microscopy studies of thin film surfaces and interfaces Klapetek P, Bursik J Applied Surface Science, 254(12), 3681, 2008 |
| 5 |
Spectroscopic ellipsometry on sinusoidal surface-relief gratings Antos R, Ohlidal I, Franta D, Klapetek P, Mistrik J, Yamaguchi T, Visnovsky S Applied Surface Science, 244(1-4), 221, 2005 |
| 6 |
Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry Franta D, Ohlidal I, Klapetek P, Cabarrocas PRI Thin Solid Films, 455-56, 399, 2004 |
| 7 |
Optical properties of ZnTe films prepared by molecular beam epitaxy Franta D, Ohlidal I, Klapetek P, Montaigne-Ramil A, Bonanni A, Stifter D, Sitter H Thin Solid Films, 468(1-2), 193, 2004 |