검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Evaluation of depth distribution and characterization of nanoscale Ta/Si multilayer thin film structures Chakraborty BR, Halder SK, Maurya KK, Srivastava AK, Toutam VK, Dalai MK, Sehgal G, Singh S Thin Solid Films, 520(20), 6409, 2012 |
| 2 |
Ion beam-induced nanostructuring of A(III)B(V) semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy Krok F, Kolodziej J, Such B, Piatkowski P, Szymonski M Applied Surface Science, 210(1-2), 112, 2003 |