| 1 |
Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate
Smentkowski VS, Duong HM, Tamaki R, Keenan MR, Ohlhausen JAT, Kotula PG
Applied Surface Science, 253(2), 1015, 2006 |
| 2 |
Maximum likelihood principal component analysis of time-of-flight secondary ion mass spectrometry spectral images
Keenan MR
Journal of Vacuum Science & Technology A, 23(4), 746, 2005 |
| 3 |
Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA
Ohlhausen JAT, Keenan MR, Kotula PG, Peebles DE
Applied Surface Science, 231-2, 230, 2004 |
| 4 |
Optimal scaling of TOF-SIMS spectrum-images prior to multivariate statistical analysis
Keenan MR, Kotula PG
Applied Surface Science, 231-2, 240, 2004 |
| 5 |
Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images-looking beyond the obvious
Smentkowski VS, Ohlhausen JA, Kotula PG, Keenan MR
Applied Surface Science, 231-2, 245, 2004 |
| 6 |
Method for measuring deuterium in erbium deuteride films
Brangan JR, Thornberg SM, Keenan MR
Journal of Vacuum Science & Technology A, 17(4), 2125, 1999 |
| 7 |
Optimal Linear Regulation with Hard Constraints
Ajbar H, Keenan MR, Kantor JC
AIChE Journal, 41(11), 2439, 1995 |
