검색결과 : 8건
No. | Article |
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1 |
Structural modification and enhanced electron emission from multiwalled carbon nanotubes grown on Ag/Fe catalysts coated Si-substrates Kaushik V, Sharma H, Girdhar P, Shukla AK, Vankar VD Materials Chemistry and Physics, 130(3), 986, 2011 |
2 |
Enhanced electron emission from titanium coated multiwalled carbon nanotubes Sharma H, Kaushik V, Girdhar P, Singh VN, Shukla AK, Vankar VD Thin Solid Films, 518(23), 6915, 2010 |
3 |
Physical and electrical characterizations of metal-oxide-semiconductor capacitors fabricated on GaAs substrates with different surface chemical treatments and Al2O3 gate dielectric Garcia-Gutierrez DI, Shahrjerdi D, Kaushik V, Banerjee SK Journal of Vacuum Science & Technology B, 27(6), 2390, 2009 |
4 |
Characteristics of atomic-layer-deposited thin HfxZr1-xO2 gate dielectrics Triyoso DH, Hegde RI, Schaeffer JK, Gregory R, Wang XD, Canonico M, Roan D, Hebert EA, Kim K, Jiang J, Rai R, Kaushik V, Samavedam SB, Rochat N Journal of Vacuum Science & Technology B, 25(3), 845, 2007 |
5 |
Electrical characterization of capacitors with AVD-deposited hafnium silicates as high-k gate dielectric Van Elshocht S, Weber U, Conard T, Kaushik V, Houssa M, Hyun S, Seitzinger B, Lehnen P, Schumacher M, Lindner J, Caymax M, De Gendt S, Heyns M Journal of the Electrochemical Society, 152(11), F185, 2005 |
6 |
Effect of postdeposition anneal conditions on defect density of HfO2 layers measured by wet etching Claes M, De Gendt S, Witters T, Kaushik V, Conard T, Zhao C, Manabe Y, Delabie A, Rohr E, Chen J, Tsai W, Heyns MM Journal of the Electrochemical Society, 151(11), F269, 2004 |
7 |
Epitaxial oxides on silicon grown by molecular beam epitaxy Droopad R, Yu ZY, Ramdani J, Hilt L, Curless J, Overgaard C, Edwards JL, Finder J, Eisenbeiser K, Wang J, Kaushik V, Ngyuen BY, Ooms B Journal of Crystal Growth, 227, 936, 2001 |
8 |
Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy Ramdani J, Droopad R, Yu Z, Curless JA, Overgaard CD, Finder J, Eisenbeiser K, Hallmark JA, Ooms WJ, Kaushik V, Alluri P, Pietambaram S Applied Surface Science, 159, 127, 2000 |