화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Structural modification and enhanced electron emission from multiwalled carbon nanotubes grown on Ag/Fe catalysts coated Si-substrates
Kaushik V, Sharma H, Girdhar P, Shukla AK, Vankar VD
Materials Chemistry and Physics, 130(3), 986, 2011
2 Enhanced electron emission from titanium coated multiwalled carbon nanotubes
Sharma H, Kaushik V, Girdhar P, Singh VN, Shukla AK, Vankar VD
Thin Solid Films, 518(23), 6915, 2010
3 Physical and electrical characterizations of metal-oxide-semiconductor capacitors fabricated on GaAs substrates with different surface chemical treatments and Al2O3 gate dielectric
Garcia-Gutierrez DI, Shahrjerdi D, Kaushik V, Banerjee SK
Journal of Vacuum Science & Technology B, 27(6), 2390, 2009
4 Characteristics of atomic-layer-deposited thin HfxZr1-xO2 gate dielectrics
Triyoso DH, Hegde RI, Schaeffer JK, Gregory R, Wang XD, Canonico M, Roan D, Hebert EA, Kim K, Jiang J, Rai R, Kaushik V, Samavedam SB, Rochat N
Journal of Vacuum Science & Technology B, 25(3), 845, 2007
5 Electrical characterization of capacitors with AVD-deposited hafnium silicates as high-k gate dielectric
Van Elshocht S, Weber U, Conard T, Kaushik V, Houssa M, Hyun S, Seitzinger B, Lehnen P, Schumacher M, Lindner J, Caymax M, De Gendt S, Heyns M
Journal of the Electrochemical Society, 152(11), F185, 2005
6 Effect of postdeposition anneal conditions on defect density of HfO2 layers measured by wet etching
Claes M, De Gendt S, Witters T, Kaushik V, Conard T, Zhao C, Manabe Y, Delabie A, Rohr E, Chen J, Tsai W, Heyns MM
Journal of the Electrochemical Society, 151(11), F269, 2004
7 Epitaxial oxides on silicon grown by molecular beam epitaxy
Droopad R, Yu ZY, Ramdani J, Hilt L, Curless J, Overgaard C, Edwards JL, Finder J, Eisenbeiser K, Wang J, Kaushik V, Ngyuen BY, Ooms B
Journal of Crystal Growth, 227, 936, 2001
8 Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy
Ramdani J, Droopad R, Yu Z, Curless JA, Overgaard CD, Finder J, Eisenbeiser K, Hallmark JA, Ooms WJ, Kaushik V, Alluri P, Pietambaram S
Applied Surface Science, 159, 127, 2000