검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Infrared spectroscopic ellipsometry of Ge-doped SbTe alloys Kang TD, Sim KI, Kim JH, Wu Z, Cheong BK, Lee H Thin Solid Films, 520(19), 6221, 2012 |
| 2 |
Investigation of the Structural and Optical Properties of Ge-doped SbTe Films with Various Sb:Te Ratios Kang TD, Sirenko A, Park JW, Lee HS, Lee S, Jeong JH, Cheong BK, Lee H Journal of the Electrochemical Society, 158(3), H249, 2011 |
| 3 |
Mueller matrices for anisotropic metamaterials generated using 4 x 4 matrix formalism Rogers PD, Kang TD, Zhou T, Kotelyanskii M, Sirenko AA Thin Solid Films, 519(9), 2668, 2011 |
| 4 |
Rotatable broadband retarders for far-infrared spectroscopic ellipsometry Kang TD, Standard E, Carr GL, Zhou T, Kotelyanskii M, Sirenko AA Thin Solid Films, 519(9), 2698, 2011 |
| 5 |
Optical properties of SiO2/nanocrystalline Si multilayers studied using spectroscopic ellipsometry Lee KJ, Kang TD, Lee HS, Hong SH, Choi SH, Seong TY, Kim KJ, Moon DW Thin Solid Films, 476(1), 196, 2005 |
| 6 |
Ellipsometry on uniaxial ZnO and Zn1-xMgxO thin films grown on (0001) sapphire substrate Kang TD, Lee H, Park WI, Yi GC Thin Solid Films, 455-56, 609, 2004 |