검색결과 : 10건
No. | Article |
---|---|
1 |
Significance of the interface regarding magnetic properties of manganese nanosilicide in silicon Ono Y, Miyazaki Y, Yabuuchi S, Kageshima H, Nagase M, Fujiwara A, Ohta E Thin Solid Films, 519(24), 8505, 2011 |
2 |
Two-dimensional emission patterns of secondary electrons from graphene layers formed on SiC(0001) Hibino H, Kageshima H, Guo FZ, Maeda F, Kotsugi M, Watanabe Y Applied Surface Science, 254(23), 7596, 2008 |
3 |
Enhanced Si and B diffusion in semiconductor-grade SiO2 and the effect of strain on diffusion Uematsu M, Kageshima H, Fukatsu S, Itoh KM, Shiraishl K, Otani M, Oshiyama A Thin Solid Films, 508(1-2), 270, 2006 |
4 |
A first-principles study of O-2 incorporation and its diffusion in compressively strained high-density silicon oxides Akiyama T, Kawamoto K, Kageshima H, Uematsu M, Nakamura K, Ito T Thin Solid Films, 508(1-2), 311, 2006 |
5 |
Electrode performance of layered LiNi0.5Ti0.5O2 prepared by ion exchange Tsuda M, Arai H, Takahashi M, Ohtsuka H, Sakurai Y, Sumitomo K, Kageshima H Journal of Power Sources, 144(1), 183, 2005 |
6 |
Systematic theoretical investigations of adsorption behavior on the GaAs(001)-c(4 x 4) surfaces Ito T, Tsutsumida K, Nakamura K, Kangawa Y, Shiraishi K, Taguchi A, Kageshima H Applied Surface Science, 237(1-4), 194, 2004 |
7 |
Two-dimensional simulation of pattern-dependent oxidation of silicon nanostructures on silicon-on-insulator substrates Uematsu M, Kageshima H, Shiraishi K, Nagase M, Horiguchi S, Takahashi Y Solid-State Electronics, 48(6), 1073, 2004 |
8 |
Microscopic mechanism of interfacial reaction during Si oxidation Akiyama T, Kageshima H Applied Surface Science, 216(1-4), 270, 2003 |
9 |
Systematic theoretical investigations of miscibility in Si1-x-yGexCy thin films Ito T, Nakamura K, Kangawa Y, Shiraishi K, Taguchi A, Kageshima H Applied Surface Science, 216(1-4), 458, 2003 |
10 |
Selectivity for O-adsorption position on dihydride Si(100) surfaces Kageshima H, Shiraishi K, Ikeda H, Zaima S, Yasuda Y Applied Surface Science, 159, 14, 2000 |