화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 A simple multistep etched termination technique for 4H-SiC GTO thyristors
Li ZG, Zhou K, Zhang L, Xu XL, Li LH, Li JT, Dai G
Solid-State Electronics, 151, 1, 2019
2 Experimental study on the 4H-SiC-based VDMOSFETs with lightly doped P-well field-limiting rings termination
He YJ, Lv HL, Tang XY, Song QW, Zhang YM, Han C, Zhang YM, Zhang YM
Solid-State Electronics, 129, 175, 2017
3 Accurate analytical modelling of cosmic ray induced failure rates of power semiconductor devices
Bauer FD
Solid-State Electronics, 53(6), 584, 2009
4 Effective edge termination design in SiCVJFET
Bhatnagar P, Horsfall AB, Wright NG, O'Neill AG, Vassilevski KV, Johnson CM
Materials Science Forum, 483, 877, 2005
5 Design and optimization of junction termination extension (JTE) for 4H-SiC high voltage Schottky diodes
Mahajan A, Skromme BJ
Solid-State Electronics, 49(6), 945, 2005
6 High power 4H-SiC PiN diodes with minimal forward voltage drift
Das MK, Sumakeris JJ, Paisley MJ, Powell A
Materials Science Forum, 457-460, 1105, 2004
7 Edge termination technique for SiC power devices
Kim HW, Bahng W, Song GH, Kim SC, Kim NK, Kim ED
Materials Science Forum, 457-460, 1241, 2004
8 Development of 10 kV 4H-SiC power DMOSFETs
Ryu SH, Agarwal A, Krishnaswami S, Richmond J, Palmour J
Materials Science Forum, 457-460, 1385, 2004
9 Performance of 4H-SiC Schottky diodes with Al-doped p-guard-ring junction termination at reverse bias
Felsl HP, Wachutka G
Materials Science Forum, 389-3, 1153, 2002
10 Design of single and multiple zone junction termination extension structures for SiC power devices
Sheridan DC, Niu GF, Cressler JD
Solid-State Electronics, 45(9), 1659, 2001