화학공학소재연구정보센터
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No. Article
1 Comparison of techniques for measuring carrier lifetime in thin-film and multicrystalline photovoltaic materials
Ahrenkiel RK, Call N, Johnston SW, Metzger WK
Solar Energy Materials and Solar Cells, 94(12), 2197, 2010
2 An optical technique for measuring surface recombination velocity
Ahrenkiel RK, Johnston SW
Solar Energy Materials and Solar Cells, 93(5), 645, 2009
3 Interaction of microwaves with photoelectrons in semiconductors
Ahrenkiel RK, Johnston SW
Journal of Vacuum Science & Technology B, 26(4), 1508, 2008
4 Lifetime analysis of silicon solar cells by microwave reflection
Ahrenkiel RK, Johnston SW
Solar Energy Materials and Solar Cells, 92(8), 830, 2008
5 Optimization of buffer layers for lattice-mismatched epitaxy of GaxIn1-xAs/InAsyP1-y double-heterostructures on InP
Ahrenkiel SP, Wanlass MW, Carapella JJ, Ahrenkiel RK, Johnston SW, Gedvilas LM
Solar Energy Materials and Solar Cells, 91(10), 908, 2007
6 Comparison of a dominant electron trap in n-type and p-type GaNAs using deep-level transient spectroscopy
Johnston SW, Kurtz SR
Journal of Vacuum Science & Technology A, 24(4), 1252, 2006
7 Investigation of defect properties in Cu(In,Ga)Se-2 solar cells by deep-level transient spectroscopy
Kerr LL, Li SS, Johnston SW, Anderson TJ, Crisalle OD, Kim WK, Abushama J, Noufi RN
Solid-State Electronics, 48(9), 1579, 2004
8 MOCVD of tungsten nitride (WNx) thin films from the imido complex Cl-4(CH3CN)W((NPr)-Pr-i)
Bchir OJ, Johnston SW, Cuadra AC, Anderson TJ, Ortiz CG, Brooks BC, Powell DH, McElwee-White L
Journal of Crystal Growth, 249(1-2), 262, 2003
9 A comparison of MBE- and MOCVD-grown GaInNAs
Ptak AJ, Johnston SW, Kurtz S, Friedman DJ, Metzger WK
Journal of Crystal Growth, 251(1-4), 392, 2003
10 Measurement of charge-separation potentials in GaAs1-xNx
Johnston SW, Ahrenkiel RK, Tu CW, Hong YG
Journal of Vacuum Science & Technology A, 21(5), 1765, 2003