검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Electrical characterization of metal-oxide-semiconductor capacitors with anodic and plasma-nitrided oxides Landsberger LM, Ghayour R, Sayedi M, Kahrizi M, Landheer D, Bardwell JA, Riopel Y, Jean C, Logiudice V Journal of Vacuum Science & Technology A, 18(2), 676, 2000 |
| 2 |
Interface states distribution in electrical stressed oxynitrided gate-oxide Belkouch S, Nguyen TK, Landsberger LM, Aktik C, Jean C, Kahrizi M Journal of the Electrochemical Society, 145(7), 2489, 1998 |
| 3 |
Electrical Characterization of Oxynitrided Gate Dielectrics Under Constant-Current Fowler-Nordheim Stress Nguyen TK, Landsberger LM, Belkouch S, Jean C Journal of the Electrochemical Society, 144(9), 3299, 1997 |