1 |
Blue electroluminescence from MOS capacitors with Si-implanted SiO2 Matsuda T, Nishihara K, Kawabe M, Iwata H, Iwatsubo S, Ohzone T Solid-State Electronics, 48(10-11), 1933, 2004 |
2 |
Effect of surface roughness on magnetic properties of Fe films deposited by dual ion beam sputtering Iwatsubo S, Takahashi T, Naoe M Thin Solid Films, 343-344, 67, 1999 |
3 |
An estimation of optimum Ar ion bombardment energy for good Fe films applying thermal spike effect Iwatsubo S, Takahashi T, Naoe M Thin Solid Films, 343-344, 71, 1999 |
4 |
Adhesive characteristics of Fe films deposited by ion beam sputtering with Ar ion bombardment Iwatsubo S, Takahashi T, Naoe M Thin Solid Films, 343-344, 261, 1999 |
5 |
Structure and adhesive properties of TiN films reactively deposited by plasma-free sputtering Takahashi T, Masugata K, Iwatsubo S, Asada M Thin Solid Films, 343-344, 273, 1999 |
6 |
Magnetic and Structural-Properties of Fe Films Deposited by Ion-Beam Sputtering with a High-Energy Assisted Process Iwatsubo S, Takahashi T, Naoe M Thin Solid Films, 281-282, 484, 1996 |