| 1 |
Angular dependence of ionization probability of C2H2 in a linearly polarized intense laser field
Hasegawa H, Ikeda Y, Sonoda K, Sato T, Iwasaki A, Yamanouchi K
Chemical Physics Letters, 662, 235, 2016 |
| 2 |
Field ionization of free helium atoms: Correlation between the kinetic energy of ionized atoms and probability of their field ionization
Piskur J, Borg L, Stupnik A, Leisch M, Ernst WE, Holst B
Applied Surface Science, 254(14), 4365, 2008 |
| 3 |
Formation of atomic secondary ions in sputtering
Wucher A
Applied Surface Science, 255(4), 1194, 2008 |
| 4 |
Determination of energy dependent ionization probabilities of sputtered particles
Mazarov P, Samartsev AV, Wucher A
Applied Surface Science, 252(19), 6452, 2006 |
| 5 |
Positive secondary Ion emission from Si1-xGex bombarded by O-2(+)
Mikami A, Okazawa T, Saito K, Kido Y
Applied Surface Science, 253(3), 1620, 2006 |
| 6 |
Sputtering of indium using polyatomic projectiles
Samartsev AV, Wucher A
Applied Surface Science, 231-2, 191, 2004 |
| 7 |
The influence of oxygen on the Hf signal intensity in the characterization of HfO2/Si stacks
Huyghebaert C, Conard T, Vandervorst W
Applied Surface Science, 231-2, 552, 2004 |
| 8 |
Ionization probability of atoms and molecules sputtered from a cesium covered silver surface
Meyer S, Staudt C, Wucher A
Applied Surface Science, 203, 48, 2003 |
| 9 |
Quantitative depth profiling at silicon/silicon oxide interfaces by means of Cs+ sputtering in negative mode by ToF-SIMS: a full spectrum approach
Ferrari S, Perego A, Fanciulli A
Applied Surface Science, 203, 52, 2003 |
| 10 |
Ionization probability of sputtered cluster anions: C-n(-) and Si-n(-)
Gnaser H
Applied Surface Science, 203, 78, 2003 |
