검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Critical assessment of the determination of residual stress profiles in thin films by means of the ion beam layer removal method Schoengrundner R, Treml R, Antretter T, Kozic D, Ecker W, Kiener D, Brunner R Thin Solid Films, 564, 321, 2014 |
| 2 |
Stress measurement in thin films with the ion beam layer removal method: Influence of experimental errors and parameters Massl S, Kostenbauer H, Keckes J, Pippan R Thin Solid Films, 516(23), 8655, 2008 |