검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Anomalous degradation behaviors under illuminated gate bias stress in a-Si:H thin film transistor Tsai MY, Chang TC, Chu AK, Hsieh TY, Lin KY, Wu YC, Huang SF, Chiang CL, Chen PL, Lai TC, Lo CC, Lien A Thin Solid Films, 572, 79, 2014 |
| 2 |
Dynamics of metastable defects in a-Si : H/SiN TFTs Merticaru AR, Mouthaan AJ Thin Solid Films, 383(1-2), 122, 2001 |