검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Crystallographic defects under surface morphological defects of 4H-SiC homoepitaxial films Okada T, Kimoto T, Yamai K, Matsunami H, Inoko F Materials Science Forum, 457-460, 521, 2004 |
| 2 |
Relation between activated slip systems and nucleation of recrystallized grains in deformed single- and bi-crystals Inoko F, Kashihara K, Tagami M, Okada T Materials Science Forum, 467-470, 57, 2004 |
| 3 |
Residual-Stress and in-Situ Thermal-Stress Measurement of Aluminum Film Deposited on Silicon-Wafer Kusaka K, Hanabusa T, Nishida M, Inoko F Thin Solid Films, 290-291, 248, 1996 |