검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Application of the narrow spectral range InAs-FPA-based IR camera for the investigation of the interface voids in silicon wafer bonding Vainer BG, Kamaev GN, Kurishev GL Journal of Crystal Growth, 210(1-3), 351, 2000 |
| No. | Article |
|---|---|
| 1 |
Application of the narrow spectral range InAs-FPA-based IR camera for the investigation of the interface voids in silicon wafer bonding Vainer BG, Kamaev GN, Kurishev GL Journal of Crystal Growth, 210(1-3), 351, 2000 |