| 1 |
Anisotropic piezoelectric response of ion beam sputtered aluminum nitride thin films textured along [10(1)over-bar0]-axis: A field dependent X-ray diffraction investigation
Sharma N, Ilango S
Applied Surface Science, 452, 299, 2018 |
| 2 |
X-ray photoelectron spectroscopy studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N-2(+) ions: Substrate temperature induced compositional variations
Sharma N, Ilango S, Dash S, Tyagi AK
Thin Solid Films, 636, 626, 2017 |
| 3 |
Secondary Ion Mass Spectrometry based depth profiling of Mo/Si interfaces with different microcrystalline structure
Singh CK, Ilango S, Dash S, Tyagi AK
Materials Chemistry and Physics, 173, 475, 2016 |
| 4 |
Application of dynamic scaling theory for growth kinetic studies of AlN-thin films deposited by ion beam sputtering in reactive assistance of nitrogen plasma
Sharma N, Prabakar K, Ilango S, Dash S, Tyagi AK
Applied Surface Science, 347, 875, 2015 |
| 5 |
Pre- and post-breakdown electrical studies in ultrathin Al2O3 films by conductive atomic force microscopy
Ganesan K, Ilango S, Shanmugam M, Baroughi MF, Kamruddin M, Tyagi AK
Current Applied Physics, 13(9), 1865, 2013 |
| 6 |
Low-valent vanadium complexes of a pyrrolide-based ligand. Electronic structure of a dimeric V(I) complex with a short and weak metal-metal bond
Ilango S, Vidjayacoumar B, Gambarotta S, Giorelsky SI
Inorganic Chemistry, 47(8), 3265, 2008 |
