검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Interface properties and bias temperature instability with ternary H-Cl-N mixed plasma post-oxidation annealing in 4H-SiC MOS capacitors Yang C, Zhang FL, Yin ZP, Su Y, Qin FW, Wang DJ Applied Surface Science, 488, 293, 2019 |
| 2 |
Improved interfacial and electrical properties of HfTiON gate-dielectric Ge MOS capacitor by using LaON/Si dual passivation layer and fluorine-plasma treatment Huang Y, Xu JP, Liu L, Cheng ZX, Lai PT, Tang WM Applied Surface Science, 493, 628, 2019 |
| 3 |
Engineering the mesoporous TiO2 layer by a facile method to improve the performance of perovskite solar cells Yang MF, Zhang YH, Du JY, Yang LL, Fan L, Sui YR, Liu XY, Xue LL, Yang JH, Wang FY Electrochimica Acta, 318, 83, 2019 |
| 4 |
Amino graphene oxide/dopamine modified aramid fibers: Preparation, epoxy nanocomposites and property analysis Gong XY, Liu YY, Wang YS, Xie ZM, Dong QL, Dong MY, Liu H, Shao Q, Lu N, Murugadoss V, Ding T, Guo ZH Polymer, 168, 131, 2019 |
| 5 |
질산산화법을 이용한 SiO2/Si 구조의 계면결함 제거 최재영, 김도연, 김우병 Korean Journal of Materials Research, 28(2), 118, 2018 |
| 6 |
Magnetic and interface properties of the core-shell Fe3O4/Au nanocomposites Baskakov AO, Solov'eva AY, Ioni YV, Starchikov SS, Lyubutin IS, Khodos II, Avilov AS, Gubin SP Applied Surface Science, 422, 638, 2017 |
| 7 |
Chlorine-enhanced thermal oxides growth and significant trap density reduction at SiO2/SiC interface by incorporation of phosphorus Krol K, Sochacki M, Strupinski W, Racka K, Guziewicz M, Konarski P, Misnik M, Szmidt J Thin Solid Films, 591, 86, 2015 |
| 8 |
Raman spectroscopy of graphene on AlGaN/GaN heterostructures Dusari S, Goyal N, Debiasio M, Kenda A Thin Solid Films, 597, 140, 2015 |
| 9 |
Characterization of Y2O3 gate dielectric on n-GaAs substrates Das PS, Dalapati GK, Chi DZ, Biswas A, Maiti CK Applied Surface Science, 256(7), 2245, 2010 |
| 10 |
Numerical modelling of GaInP solar cells with AlInP and AlGaAs windows Gudovskikh AS, Kaluzhniy NA, Lantratov VM, Mintairov SA, Shvarts MZ, Andreev VM Thin Solid Films, 516(20), 6739, 2008 |