| 1 |
In-situ determination of thickness and electrochemical properties of barrier oxide film on impure aluminium in aqueous solution
Giskeodegard NH, Hunderi O, Nisancioglu K
Journal of Applied Electrochemistry, 48(6), 569, 2018 |
| 2 |
Properties of oxide formed on aluminium in aqueous acetate buffer
Giskeodegard N, Blajiev O, Hubin A, Terryn H, Hunderi O, Nisancioglu K
Materials Science Forum, 519-521, 717, 2006 |
| 3 |
On the AlAs/GaAs (001) interface dielectric anisotropy
Hunderi O, Zettler JT, Haberland K
Thin Solid Films, 472(1-2), 261, 2005 |
| 4 |
The correlation theory of 2D normal grain growth
Nordbakke MW, Ryum N, Hunderi O
Materials Science Forum, 467-470, 1081, 2004 |
| 5 |
Optical and magnetooptical properties of bismuth and gallium substituted iron garnet films
Hansteen F, Helseth LE, Johansen TH, Hunderi O, Kirilyuk A, Rasing T
Thin Solid Films, 455-56, 429, 2004 |
| 6 |
Optical constants of indium tin oxide films as determined by a surface plasmon phase method
Vaicikauskas V, Bremer J, Hunderi O, Antanavicius R, Januskevicius R
Thin Solid Films, 411(2), 262, 2002 |
| 7 |
Investigation of variable incidence angle spectroscopic ellipsometry for determination of below band gap uniaxial dielectric function
Kildemo M, Hunderi O
Materials Science Forum, 353-356, 417, 2001 |
| 8 |
Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1-4, 1999 - Preface
Zettler T, Hunderi O, Del Sole R
Thin Solid Films, 364(1-2), IX, 2000 |
| 9 |
A direct robust feedback method for growth control of optical coatings by multiwavelength ellipsometry
Kildemo M, Drevillon B, Hunderi O
Thin Solid Films, 313-314, 484, 1998 |
| 10 |
Ellipsometric and reflectance-anisotropy measurements on rotating samples
Haberland K, Hunderi O, Pristovsek M, Zettler JT, Richter W
Thin Solid Films, 313-314, 620, 1998 |
