화학공학소재연구정보센터
검색결과 : 44건
No. Article
1 Novel GaN-based vertical heterostructure field effect transistor structures using crystallographic KOH etching and overgrowth
Qian H, Lee KB, Vajargah SH, Novikov SV, Guiney I, Zaidi ZH, Jiang S, Wallis DJ, Foxon CT, Humphreys CJ, Houston PA
Journal of Crystal Growth, 459, 185, 2017
2 Origins of hillock defects on GaN templates grown on Si(111)
Han Y, Zhu D, Zhu T, Humphreys CJ, Wallis DJ
Journal of Crystal Growth, 434, 123, 2016
3 Growth of free-standing bulk wurtzite AlxGa1-xN layers by molecular beam epitaxy using a highly efficient RF plasma source
Novikov SV, Staddon CR, Sahonta SL, Oliver RA, Humphreys CJ, Foxon CT
Journal of Crystal Growth, 456, 151, 2016
4 The impact of substrate miscut on the microstructure and photoluminescence efficiency of (0001) InGaN quantum wells grown by a two-temperature method
Massabuau FCP, Tartan CC, Traynier R, Blenkhorn WE, Kappers MJ, Dawson P, Humphreys CJ, Oliver RA
Journal of Crystal Growth, 386, 88, 2014
5 Evaluation of growth methods for the heteroepitaxy of non-polar (11(2)over-bar0) GAN on sapphire by MOVPE
Oehler F, Sutherland D, Zhu T, Emery R, Badcock TJ, Kappers MJ, Humphreys CJ, Dawson P, Oliver RA
Journal of Crystal Growth, 408, 32, 2014
6 Surface morphology of homoepitaxial c-plane GaN: Hillocks and ridges
Oehler F, Zhu T, Rhode S, Kappers MJ, Humphreys CJ, Oliver RA
Journal of Crystal Growth, 383, 12, 2013
7 The effect of dislocations on the efficiency of InGaN/GaN solar cells
Zhang Y, Kappers MJ, Zhu D, Oehler F, Gao F, Humphreys CJ
Solar Energy Materials and Solar Cells, 117, 279, 2013
8 Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements
Elsherif OS, Vernon-Parry KD, Dharmadasa IM, Evans-Freeman JH, Airey RJ, Kappers MJ, Humphreys CJ
Thin Solid Films, 520(7), 3064, 2012
9 Defect reduction processes in heteroepitaxial non-polar a-plane GaN films
Hao R, Kappers MJ, Moram MA, Humphreys CJ
Journal of Crystal Growth, 337(1), 81, 2011
10 Low dislocation density GaN growth on high-temperature AlN buffer layers on (0001) sapphire
Kappers MJ, Moram MA, Rao DVS, McAleese C, Humphreys CJ
Journal of Crystal Growth, 312(3), 363, 2010