검색결과 : 3건
No. | Article |
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1 |
Application of Raman spectroscopy for depth-dependent evaluation of the hydrogen concentration of amorphous silicon Maurer C, Haas S, Beyer W, Maier FC, Zastrow U, Hulsbeck M, Breuer U, Rau U Thin Solid Films, 653, 223, 2018 |
2 |
Differences in the structure composition of microcrystalline silicon solar cells deposited by HWCVD and PECVD: Influence on open circuit voltage Mai Y, Klein S, Geng X, Hulsbeck M, Carius R, Finger F Thin Solid Films, 501(1-2), 272, 2006 |
3 |
Preparation of microcrystalline silicon seed-layers with defined structural properties Vetterl O, Hulsbeck M, Wolff J, Carius R, Finger E Thin Solid Films, 427(1-2), 46, 2003 |