검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Physics-based stability analysis of MOS transistors Ferrara A, Steeneken PG, Boksteen BK, Heringa A, Scholten AJ, Schmitz J, Hueting RJE Solid-State Electronics, 113, 28, 2015 |
| 2 |
Integration of epitaxial Pb(Zr0.52Ti0.48)O-3 films on GaN/AlGaN/GaN/Si(111) substrates using rutile TiO2 buffer layers Elibol K, Nguyen MD, Hueting RJE, Gravesteijn DJ, Koster G, Rijnders G Thin Solid Films, 591, 66, 2015 |
| 3 |
Strain characterization of FinFETs using Raman spectroscopy Kaleli B, van Hemert T, Hueting RJE, Wolters RAM Thin Solid Films, 541, 57, 2013 |
| 4 |
BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates Tiggelman MPJ, Reimann K, Klee M, Mauczock R, Keur W, Hueting RJE Thin Solid Films, 518(10), 2854, 2010 |