검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
STI-to-gate distance effects on flicker noise characteristics in 0.13 mu m CMOS Chan CY, Huang YC, Chen JW, Hsu SSH, Juang YZ Solid-State Electronics, 52(8), 1182, 2008 |
| 2 |
Interfacial trap characteristics in depletion mode GaAs MOSFETs Lee TC, Chan CY, Tsai PJ, Hsu SSH, Kwo J, Hong M Journal of Crystal Growth, 301, 1009, 2007 |