화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 InAs/AlSb high-electron-mobility transistors by molecular-beam epitaxy for low-power applications
Lange MD, Tsai RS, Deal WR, Nam PS, Lee LJ, Sandhu RS, Hsing R, Poust BD, Kraus JL, Gutierrez-Aitken AL, Bennett BR, Boos JB, Noori AM, Hayashi SL, Goorsky MS
Journal of Vacuum Science & Technology B, 24(6), 2581, 2006
2 Strain relaxation and surface roughness of InxAl1-xAs graded buffer layers grown on InP for 6.05 angstrom applications
Noori AM, Sandhu RS, Hayashi SL, Meserole ED, Hardev V, Cavus A, Lange M, Monier C, Hsing R, Sawdai D, Wojtowicz M, Block TR, Gutierrez-Aitken A, Goorsky MS
Journal of Vacuum Science & Technology B, 22(5), 2303, 2004
3 Interfacial roughness and carrier scattering due to misfit dislocations in In0.52Al0.48As/In0.75Ga0.25As/InP structures
Naidenkova M, Goorsky MS, Sandhu R, Hsing R, Wojtowicz M, Chin TP, Block TR, Streit DC
Journal of Vacuum Science & Technology B, 20(3), 1205, 2002
4 Strain compensation in In0.75Ga0.25As/InP pseudomorphic high electron mobility transistors using strained InAlAs buffers
Goorsky MS, Sandhu R, Hsing R, Naidenkova M, Wojtowicz M, Chin TP, Block TR, Streit DC
Journal of Vacuum Science & Technology B, 18(3), 1658, 2000