화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Friction Forces on Hydrogen Passivated (110) Silicon and Silicon Dioxide Studied by Scanning Force Microscopy
Scandella L, Meyer E, Howald L, Luthi R, Guggisberg M, Gobrecht J, Guntherodt HJ
Journal of Vacuum Science & Technology B, 14(2), 1255, 1996
2 Influence of Humidity on Friction Measurements of Supported MoS2 Single Layers
Schumacher A, Kruse N, Prins R, Meyer E, Luthi R, Howald L, Guntherodt HJ, Scandella L
Journal of Vacuum Science & Technology B, 14(2), 1264, 1996
3 Friction on the Atomic-Scale - An Ultrahigh-Vacuum Atomic-Force Microscopy Study on Ionic-Crystals
Luthi R, Meyer E, Bammerlin M, Howald L, Haefke H, Lehmann T, Loppacher C, Guntherodt HJ, Gyalog T, Thomas H
Journal of Vacuum Science & Technology B, 14(2), 1280, 1996
4 Site-Specific Friction Force Spectroscopy
Meyer E, Luthi R, Howald L, Bammerlin M, Guggisberg M, Guntherodt HJ
Journal of Vacuum Science & Technology B, 14(2), 1285, 1996
5 Development of a Mesoscale/Nanoscale Plasma Generator
Terashima K, Howald L, Haefke H, Guntherodt HJ
Thin Solid Films, 281-282, 634, 1996
6 Progress in Noncontract Dynamic Force Microscopy
Luthi R, Meyer E, Howald L, Haefke H, Anselmetti D, Dreier M, Ruetsche M, Bonner T, Overney RM, Frommer J, Guntherodt HJ
Journal of Vacuum Science & Technology B, 12(3), 1673, 1994
7 Elasticity, Wear, and Friction Properties of Thin Organic Films Observed with Atomic-Force Microscopy
Overney RM, Bonner T, Meyer E, Reutschi M, Luthi R, Howald L, Frommer J, Guntherodt HJ, Fujihara M, Takano H
Journal of Vacuum Science & Technology B, 12(3), 1973, 1994
8 Scanning Probe Microscopy on the Surface of Si(111)
Meyer E, Howald L, Luthi R, Haefke H, Ruetschi M, Bonner T, Overney R, Frommer J, Hofer R, Guntheroidt HJ
Journal of Vacuum Science & Technology B, 12(3), 2060, 1994
9 Friction Force Microscopy on Clean Surfaces of NaCl, NaF, and AgBr
Howald L, Luthi R, Meyer E, Gerth G, Haefke HG, Overney R, Guntherodt HJ
Journal of Vacuum Science & Technology B, 12(3), 2227, 1994
10 Statics and Dynamics of Ferroelectric Domains Studied with Scanning Force Microscopy
Luthi R, Haefke H, Gutmannsbauer W, Meyer E, Howald L, Guntherodt HJ
Journal of Vacuum Science & Technology B, 12(4), 2451, 1994