화학공학소재연구정보센터
검색결과 : 21건
No. Article
1 Structural and optical properties of WS2 prepared using sulfurization of different thick sputtered tungsten films
Hotovy I, Spiess L, Sojkova M, Kostic I, Mikolasek M, Predanocy M, Romanus H, Hulman M, Rehacek V
Applied Surface Science, 461, 133, 2018
2 Potentiostatic electrodeposition under light irradiation for preparation of highly photoactive Cu2O for water splitting applications
Mikolasek M, Ondrejka P, Chymo F, Novak P, Pavuk M, Novotny I, Rehacek V, Breza J, Vincze A, Hotovy I
Applied Surface Science, 461, 196, 2018
3 Structural, optical and electrical properties of sputtered NiO thin films for gas detection
Predanocy M, Hotovy I, Caplovicova M
Applied Surface Science, 395, 208, 2017
4 The layers of carbon nanomaterials as the base of ohmic contacts to p-GaN
Liday J, Vogrincic P, Vretenar V, Kotlar M, Marton M, Vavra I, Hotovy I, Breza J, Rehacek V
Applied Surface Science, 312, 63, 2014
5 A model of trap-assisted tunneling in GaN/AlGaN/GaN heterostructure based on exchange times
Racko J, Benko P, Hotovy I, Harmatha L, Mikolasek M, Granzner R, Kittler M, Schwierz F, Breza J
Applied Surface Science, 312, 68, 2014
6 Patterning of titanium oxide surfaces using inductively coupled plasma for gas sensing
Hotovy I, Kostic I, Hascik S, Rehacek V, Predanocy M, Bencurova A
Applied Surface Science, 312, 107, 2014
7 Double layer films based on TiO2 and NiOx for gas detection
Kosc I, Hotovy I, Roch T, Plecenik T, Gregor M, Predanocy M, Cehlarova M, Kus P, Plecenik A
Applied Surface Science, 312, 120, 2014
8 Sputtered ITO for application in thin-film silicon solar cells: Relationship between structural and electrical properties
Hotovy J, Hupkes J, Bottler W, Marins E, Spiess L, Kups T, Smirnov V, Hotovy I, Kovac J
Applied Surface Science, 269, 81, 2013
9 Sputtered TiO2 thin films with NiO additives for hydrogen detection
Kosc I, Hotovy I, Rehacek V, Griesseler R, Predanocy M, Wilke M, Spiess L
Applied Surface Science, 269, 110, 2013
10 Nafion-coated bismuth film electrodes on pyrolyzed photoresist/alumina supports for analysis of trace heavy metals
Rehacek V, Hotovy I, Vojs M, Kups T, Spiess L
Electrochimica Acta, 63, 192, 2012