검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
On determining the optical properties and layer structure from spectroscopic ellipsometric data using automated artifact minimization method Budai J, Farkas B, Horvath ZL, Geretovszky Z Thin Solid Films, 567, 14, 2014 |
| 2 |
Generation of Diffraction-Free Beams for Applications in Optical Microlithography Erdelyi M, Horvath ZL, Szabo G, Bor Z, Tittel FK, Cavallaro JR, Smayling MC Journal of Vacuum Science & Technology B, 15(2), 287, 1997 |