검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
SIMS quantification of matrix and impurity species in AlxGa1-xN Gu CJ, Stevie FA, Hitzman CJ, Saripalli YN, Johnson M, Griffis DP Applied Surface Science, 252(19), 7228, 2006 |
| 2 |
SiO2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry Cole DA, Shallenberger JR, Novak SW, Moore RL, Edgell MJ, Smith SP, Hitzman CJ, Kirchhoff JF, Principe E, Nieveen W, Huang FK, Biswas S, Bleiler RJ, Jones K Journal of Vacuum Science & Technology B, 18(1), 440, 2000 |
| 3 |
Surface quantification by ion implantation through a removable layer Stevie FA, Roberts RF, McKinley JM, Decker MA, Granger CN, Santiesteban R, Hitzman CJ Journal of Vacuum Science & Technology B, 18(1), 483, 2000 |