검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Resonant surface-enhanced Raman scattering by optical phonons in a monolayer of CdSe nanocrystals on Au nanocluster arrays Milekhin AG, Sveshnikova LL, Duda TA, Rodyakina EE, Dzhagan VM, Sheremet E, Gordan OD, Himcinschi C, Latyshev AV, Zahn DRT Applied Surface Science, 370, 410, 2016 |
| 2 |
Investigations of Ar ion irradiation effects on nanocrystalline SiC thin films Craciun V, Craciun D, Socol G, Behdad S, Boesl B, Himcinschi C, Makino H, Socol M, Simeone D Applied Surface Science, 374, 339, 2016 |
| 3 |
Fabrication of periodical surface structures by picosecond laser irradiation of carbon thin films: transformation of amorphous carbon in nanographite Popescu C, Dorcioman G, Bita B, Besleaga C, Zgura I, Himcinschi C, Popescu AC Applied Surface Science, 390, 236, 2016 |
| 4 |
Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films Talkenberger A, Himcinschi C, Weissbach T, Vijayanandhini K, Vrejoiu I, Roder C, Rafaja D, Kortus J Thin Solid Films, 520(14), 4590, 2012 |
| 5 |
Asymmetry between Absorption and Photoluminescence Line Shapes of TPD: Spectroscopic Fingerprint of the Twisted Biphenyl Core Scholz R, Gisslen L, Himcinschi C, Vragovic I, Calzado EA, Louis E, Maroto ESF, Diaz-Garcia MA Journal of Physical Chemistry A, 113(1), 315, 2009 |
| 6 |
Growth and characterization of thin films prepared from perfluoro-isopropyl-substituted perfluorophthalocyanines Keil C, Tsaryova O, Lapok L, Himcinschi C, Wohrle D, Hild OR, Zahn DRT, Gorun SM, Schlettwein D Thin Solid Films, 517(15), 4379, 2009 |
| 7 |
High-density-plasma (HDP)-CVD oxide to thermal oxide wafer bonding for strained silicon layer transfer applications Singh R, Radu I, Reiche M, Himcinschi C, Kuck B, Tillack B, Gosele U, Christiansen SH Applied Surface Science, 253(7), 3595, 2007 |
| 8 |
Uniaxially strained silicon by wafer bonding and layer transfer Himcinschi C, Radu I, Muster F, Singh R, Reiche M, Petzold M, Gosele U, Christiansen SH Solid-State Electronics, 51(2), 226, 2007 |
| 9 |
Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy Himcinschi C, Friedrich M, Fruhauf S, Schulz SE, Gessner T, Zahn DRT Thin Solid Films, 455-56, 433, 2004 |
| 10 |
VASE and IR spectroscopy: excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100) Friedrich M, Himcinschi C, Salvan G, Anghel M, Paraian A, Wagner T, Kampen TU, Zahn DRT Thin Solid Films, 455-56, 586, 2004 |