| 1 |
Fractal analysis of hillocks: A case of RF sputtered aluminum thin films
Mwema FM, Akinlabi ET, Oladijo OP
Applied Surface Science, 489, 614, 2019 |
| 2 |
Evolution of hillocks in Bi thin films and their removal upon nanoscale mechanical polishing
Koseva R, Monch I, Meier D, Schumann J, Arndt KF, Schultz L, Zhao B, Schmidt OG
Thin Solid Films, 520(17), 5589, 2012 |
| 3 |
Effect of current density and electrolyte concentration on hillock growth from pure bright Sn electrodeposits
Moon KW, Kim SK, Williams ME, Boettinger WJ, Stafford GR
Journal of Applied Electrochemistry, 40(9), 1671, 2010 |
| 4 |
Electrical properties of AlNx/Al/Mo composite film prepared for use in thin-film transistors
Kao MT, Lin JF
Thin Solid Films, 518(14), 3917, 2010 |
| 5 |
Surface topography (nano-sized hillocks) and particle emission of metals, dielectrics and semiconductors during ultra-short-laser ablation: Towards a coherent understanding of relevant processes
Bashir S, Rafique MS, Husinsky W
Applied Surface Science, 255(20), 8372, 2009 |
| 6 |
Impact of laser produced X-rays on the surface of gold
Latif H, Rafique MS, Khaleeq-ur-Rahaman M, Rawat RS, Sattar A, Naseem S, Lee P
Applied Surface Science, 254(22), 7505, 2008 |
| 7 |
In-situ atomic force microscopy of silicon(100) in aqueous potassium hydroxide
Raisch P, Haiss W, Nichols RJ, Schiffrin DJ
Electrochimica Acta, 45(28), 4635, 2000 |
| 8 |
Gaseous etching of 6H-SiC at relatively low temperatures
Xie ZY, Wei CH, Li LY, Yu QM, Edgar JH
Journal of Crystal Growth, 217(1-2), 115, 2000 |
| 9 |
Electrical Control of Surface Electromigration Damage
Vook RW
Thin Solid Films, 305(1-2), 286, 1997 |
