검색결과 : 1건
No. | Article |
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1 |
Characterization of high-k gate dielectric films using SIMS Yamamoto T, Morita N, Sugiyama N, Karen A, Okuno K Applied Surface Science, 203, 516, 2003 |
No. | Article |
---|---|
1 |
Characterization of high-k gate dielectric films using SIMS Yamamoto T, Morita N, Sugiyama N, Karen A, Okuno K Applied Surface Science, 203, 516, 2003 |