검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Influence of preparation parameters for low-energy ion beam nitridation of III-V semiconductor surfaces Hecht JD, Frost F, Sidorenko A, Hirsch D, Neumann H, Schindler A, Krasnikow S, Zhang L, Chasse T Solid-State Electronics, 47(3), 413, 2003 |
| 2 |
In situ characterization of the nitridation of AIII-BV semiconductor surfaces by means of X-ray photoelectron spectroscopy Hecht JD, Frost F, Chasse T, Hirsch D, Neumann H, Schindler A, Bigl F Applied Surface Science, 179(1-4), 196, 2001 |
| 3 |
Ellipsometric studies on semiconductor microcavity IR-detector structures Rheinlander B, Kovac J, Hecht JD, Borgulova J, Uherek F, Waclawek J, Gottschalch V, Barna P Thin Solid Films, 313-314, 599, 1998 |