검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Comparison of contact radius models for ultrashallow spreading resistance profiles Hartford EJ, Ramey SM, Ye CW, Hartford CL Journal of Vacuum Science & Technology B, 18(1), 401, 2000 |
| 2 |
High-resolution damage depth profiles of unannealed sub-100 nm B+ implants in (100) silicon Hartford CL, Hillard RJ, Mazur RG, Foad MA Journal of Vacuum Science & Technology B, 16(1), 316, 1998 |
| 3 |
Evaluation of diamond-ground beveled surfaces with Hg gate capacitance-voltage and current-voltage Hillard RJ, Sherbondy JC, Hartford CL, Weinzierl SR, Maur RG Journal of Vacuum Science & Technology B, 16(1), 411, 1998 |